The Proceedings of Conference of Tohoku Branch
Online ISSN : 2424-2713
2014.49
Session ID : 137
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137 Explication of the Dominant Factors of the Crystallinity of Grain Boundaries in Polycrystalline Thin Films
Chuanhong Fan, Ken Suzuki, Hideo Miura
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Keywords: Reliability, Grain boundaries, Electron diffraction, Thin film, Measurement technology
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© 2014 The Japan Society of Mechanical Engineers
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