The Proceedings of Conference of Tohoku Branch
Online ISSN : 2424-2713
2019.54
Session ID : 170
Conference information

Crystallinity dependence of reliability of electroplated gold thin film interconnections
*Yutaro NakoshiKen SuzukiHideo Miura
Author information
CONFERENCE PROCEEDINGS RESTRICTED ACCESS

Details
Article 1st page
Content from these authors
© 2019 The Japan Society of Mechanical Engineers
Previous article Next article
feedback
Top