Proceedings of the 1992 Annual Meeting of JSME/MMD
Online ISSN : 2433-1287
2000
Conference information
Evaluation of interface strength at edge of thin films
Tadahiro SHIBUTANI, Takayuki KITAMURA
Author information
Keywords: Micro Testing, Thin Film, Delamination, Interface Strength, Stress Singularity
CONFERENCE PROCEEDINGS FREE ACCESS

Pages 225-226

Details
Download PDF (298K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Article 1st page
Content from these authors
© 2000 The Japan Society of Mechanical Engineers
Previous article Next article
Favorites & Alerts

Recently viewed articles
Announcements from publisher
Successor

The Proceedings of the Materials and Mechanics Conference

Share this page
feedback
 Top