Proceedings of the 1992 Annual Meeting of JSME/MMD
Online ISSN : 2433-1287
2001
Session ID : 244
Conference information
244 Sensitivity Enhancement for Measurement of Nano-scopic Elasticity Based on Contact Resonance of AFM Cantilever with a Concentrated Mass
Mikio MURAOKA, Hiroki KAMATA, Noboru YOSHIMURA
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Keywords: Atomic Force Microscopy, Contact Stiffness, Cantilever, Resonance, Concentrated Mass
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© 2001 The Japan Society of Mechanical Engineers
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