Proceedings of the 1992 Annual Meeting of JSME/MMD
Online ISSN : 2433-1287
2001
Session ID : 528
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528 Verification of the Governing Parameter for Electromigration Damage in Polycrystalline Line with Passivation Layer
Kazuhiko SASAGAWA, Masataka HASEGAWA, Masumi SAKA, Hiroyuki ABE
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Keywords: Electromigration, Atomic Flux Divergence, Governing Parameter, Passivated Polycrystalline Line
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© 2001 The Japan Society of Mechanical Engineers
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