Proceedings of the 1992 Annual Meeting of JSME/MMD
Online ISSN : 2433-1287
2005
Session ID : P109
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P109 Assessment of influence on the drop impact reliability for the electronic components
Qiang YU, Toshihiro TSURUSAWA, Tsuyoki SHIBATA, Masaki SHIRATORI, Takayoshi KATAHIRA
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Keywords: Drop impact reliability, Transient response analysis, Repeated drop test
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© 2005 The Japan Society of Mechanical Engineers
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