Journal of the Society of Materials Science, Japan
Online ISSN : 1880-7488
Print ISSN : 0514-5163
ISSN-L : 0514-5163
Lecture
Characterization of Microstructures by X-Ray Diffraction Line Profile Analysis
II. Line Profile Analysis Using Synchrotron Radiation
Takahisa SHOBU, Ayumi SHIRO, Yutaka YOSHIDA
Author information
Keywords: Synchrotron radiation, Line profile analysis, Dislocation density, In-situ measurement
JOURNAL FREE ACCESS

2020 Volume 69 Issue 4 Pages 343-347

Details
Download PDF (2407K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Article 1st page
Content from these authors
© 2020 by The Society of Materials Science, Japan
Previous article Next article
Favorites & Alerts

Recently viewed articles
Predecessor

journal of the Japan Society for Testing Materials

Share this page
feedback
 Top