Journal of the Society of Materials Science, Japan
Online ISSN : 1880-7488
Print ISSN : 0514-5163
ISSN-L : 0514-5163
Lecture
Characterization of Microstructures by X-Ray Diffraction Line Profile Analysis
II. Line Profile Analysis Using Synchrotron Radiation
Takahisa SHOBU, Ayumi SHIRO, Yutaka YOSHIDA
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Keywords: Synchrotron radiation, Line profile analysis, Dislocation density, In-situ measurement
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2020 Volume 69 Issue 4 Pages 343-347

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© 2020 by The Society of Materials Science, Japan

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