Journal of the Society of Materials Science, Japan
Online ISSN : 1880-7488
Print ISSN : 0514-5163
ISSN-L : 0514-5163
Lecture
Characterization of Microstructures by X-Ray Diffraction Line Profile Analysis
III: Applications of Line Profile Analysis
Masayuki NISHIDA, Tadafumi HASHIMOTO, Masayoshi KUMAGAI
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Keywords: X-ray & neutron diffraction, Line profile analysis, Dislocation density, Crystal defects, Characterization
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2020 Volume 69 Issue 5 Pages 421-426

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