Journal of the Society of Materials Science, Japan
Online ISSN : 1880-7488
Print ISSN : 0514-5163
ISSN-L : 0514-5163
Technical Topic
Defect Imaging Technique Using Guided Waves and Their Diffuse Fields in a Plate-Like Structure
Takahiro HAYASHI
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Keywords: Guided waves, Plate inspection, Defect imaging, Diffuse field
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2020 Volume 69 Issue 8 Pages 593-598

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