Abstract
The creep characteristics of tungsten of drawn 10μφ wire, annealed 10μφ wire and 0.2mmφ wire were studied in the temperature range from 1000°K to 1940°K under the stress of 121-1443gr/mm2 in the vacuum of 10-6mmHg.
Although the data obtained showed appreciable scatter, the activation energies for creep of these three kinds of wires were obtained as 140Kcal/mol., considering the effect of the recrystal lization during the creep and the effect of surface tension on decreasing the creep-rate. The obtained energy is consistent with that of self-diffusion.
From the microscopic observations of the specimens, the scatter of the data could partly be accounted for the scatter of the degree of recrystal lization and the imhomogeneity of recrystallization. It was suggested that the brittle behavior of the fracture was resulted from the pore formation during creep.
