Journal of the Society of Materials Science, Japan
Online ISSN : 1880-7488
Print ISSN : 0514-5163
ISSN-L : 0514-5163
Application of Fourier Analysis to the X-Ray Stress Measurement
Tamon INOUE
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1965 Volume 14 Issue 147 Pages 978-982

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Abstract
A new method of Fourier analysis for analysis of X-ray diffraction pattern has been developed. By this method minute variation of profiles is expressed as changes of the phase and absolute value of Fourier transforms of the observed X-ray diffraction pattern. The phase change is related to the peak shift of the profile, and thereby stress is accurately determined. The reliability of this method is confirmed by numerical simulation. The accuracy index shows more than ten times as high as that by the usual methods. By application of this method in determining the stress in steel turbine wings its accurate value is obtained.
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