Journal of the Society of Materials Science, Japan
Online ISSN : 1880-7488
Print ISSN : 0514-5163
ISSN-L : 0514-5163
The X-Ray Stress Measuring Apparatus
Kenjiro HASHIMOTOYoshinaga MORIWAKIHiroshi TSUTSUI
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1966 Volume 15 Issue 159 Pages 814-817

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Abstract
In this paper, the new type X-ray apparatus for stress measurement is described, specially designed to measure the stress of the large unmovable samples.
After the light-weight measuring stand is set to the point to be measured, the X-ray tube head, which is completely balanced in weight for free setting, is fixed to the stand magnetically, so the setting action is very easy compared with a conventional apparatus.
This apparatus can be used as both the photographic method and the G.M. counter method, and the useful scanning diffraction angle 2θ is from 142° to 170° instead of 165° in a conventional one.
Designed to make it fit for use in the field service, the whole unit is mounted on one cart containing the cooling tank for the X-ray tube.
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© by The Society of Materials Science, Japan
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