Published: June 15, 1972Received: -Available on J-STAGE: June 03, 2009Accepted: April 10, 1972
Advance online publication: -
Revised: -
Correction information
Date of correction: June 03, 2009Reason for correction: -Correction: TITLEDetails: Wrong : LECTURE Right : X-Ray Method of Stress Measurement and its Application (II)
Date of correction: June 03, 2009Reason for correction: -Correction: AUTHORDetails: Right : K. Hayashi1)
Date of correction: June 03, 2009Reason for correction: -Correction: AFFILIATIONDetails: [in Japanese]
Date of correction: June 03, 2009Reason for correction: -Correction: CITATIONDetails: Right : 15) Ishii, K., M. Iwamoto, T. Shiraiwa, and Y. Sakamoto, SAE SP-362, No. 710280 (1968) SAE 23) Konaga, T., and K. Honda, Proc. 13th Japan Cong. Mat. Res., p. 1 (1970). 24) Konaga, T., and N. Toi, Proc. 13th Japan Cong. Mat. Res., p. 7 (1970). 31) Nishioka, K., K. Ishii, and H. Komatsu, Jnl. Mat., 4, 413 (1969). 41) Reuß, A., Zeits. and Math. Mech., 9, 49 (1929). 42) Voigt, W., “Lehrbuch der Kristallphysik,” p. 962 (1928) Berlin 50) Bollenrath, F., V. Hauk, and W. Ohly, Zeits. Metallkde., 57, 464 (1966). 53) Donachie, M. J., and J. T. Norton, Trans. Met. Soc. AIME, 221, 962 (1961). 55) Greenough, G. B., Proc. Roy. Soc., A167, 556 (1949). 56) Auld, J. H., and G. B. Greenough, Acta Met., 2, 209 (1954). 103) Freneh, D. N., J. Am. Ceramic Soc., 267 (1969). 104) Cheskis, H. P., and R. W. Heckel, Met. Trans., 1, 1931 (1970).