Published: September 15, 1988Received: -Available on J-STAGE: June 03, 2009Accepted: February 09, 1988
Advance online publication: -
Revised: -
Correction information
Date of correction: June 03, 2009Reason for correction: -Correction: TITLEDetails: Wrong : LECTURE Right : Advanced Methods of X-Ray Stress Measurement Today
Date of correction: June 03, 2009Reason for correction: -Correction: SUBTITLEDetails: Right : 5. Material Strength Evaluation and Damage Detection by X-Ray Diffraction
Date of correction: June 03, 2009Reason for correction: -Correction: AUTHORDetails: Right : T. Gotoh1)
Date of correction: June 03, 2009Reason for correction: -Correction: AFFILIATIONDetails: [in Japanese]
Date of correction: June 03, 2009Reason for correction: -Correction: CITATIONDetails: Right : 11) V. Weiss and M. R. James, “Residual Stresses in Science and Technology”, Vol. 1, 41 (1987) Informationgesellschaft Verlag. 12) R. N. Pangborn, S. Weissmann and I. R. Kramer, Metall. Trans., A-12, 109 (1981). 14) S. Taira, ASTM STP 520, 80 (1973).