1991 Volume 40 Issue 454 Pages 934-940
A method for measuring strain by analyzing the sharpness of first-order pseudo-Kikuchi line in Electron Channelling Pattern (ECP) was newly developed. The relative value of sharpness of first-order pseudo-Kikuchi line, which is the ratio of sharp ones in the first-order pseudo-Kikuchi lines, was used as a parameter of strain. Fe-3.25% Si alloy single crystal and polycrystal were used as the test specimens. Strain changes during their deformation and recrystallization were analyzed by this method. The main results obtained are as follows.
(1) This method is useful for measuring strain in material with any crystal orientation.
(2) The relative value of sharpness of first-order pseudo-Kikuchi line decreased as strain was increased. This method is useful for measuring strain less than 15% cold reduction.
(3) The relative value of sharpness of first-order pseudo-Kikuchi lines was influenced by the initial crystal orientation before deformation. This phenomenon, recognized specially in the case of smaller strain, shows that accumulated strain is mainly influenced by the initial crystal orientation before deformation.
(4) It is thought that this method is useful for analyzing crystal orientation dependence of accumulated strain and release of strain during recovery and recrystallization, as well as inhomogeneity of strain in the grain interior and near the grain boundary.
