Published: November 15, 1998Received: March 19, 1998Available on J-STAGE: June 03, 2009Accepted: March 19, 1998
Advance online publication: -
Revised: -
Correction information
Date of correction: June 03, 2009Reason for correction: -Correction: DTRECEIVEDDetails: Right : 19980319
Date of correction: June 03, 2009Reason for correction: -Correction: TITLEDetails: Wrong : Lecture Right : The Fundamental Principles and Techniques of X-Ray Stress Measurement and Current Developments in the Field
Date of correction: June 03, 2009Reason for correction: -Correction: SUBTITLEDetails: Right : I: The Fundamental Principles and Techniques of X-Ray Stress Measurement
Date of correction: June 03, 2009Reason for correction: -Correction: AUTHORDetails: Right : Toru GOTO1), Shin-ichi OHYA2)
Date of correction: June 03, 2009Reason for correction: -Correction: AFFILIATIONDetails: Right :
1) Dept. of Mech. Eng., Fukui Univ. of Tech.
2) Dept. Mech. Systems Eng., Musashi Inst. of Tech.
Date of correction: June 03, 2009Reason for correction: -Correction: KEYWORDDetails: Right : X-ray stress measurement, Residual stress, X-ray diffraction, Sin2ψ method
Date of correction: June 03, 2009Reason for correction: -Correction: CITATIONDetails: [in Japanese]