Journal of the Society of Materials Science, Japan
Online ISSN : 1880-7488
Print ISSN : 0514-5163
ISSN-L : 0514-5163
X-Ray Stress Analysis for Polycrystalline Materials with Preferred Orientation
Shouichi EJIRIToshihiko SASAKIMasaharu MIYANOYukio HIROSE
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1999 Volume 48 Issue 7 Pages 705-710

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Abstract
The commonly used X-ray stress measurement, so-called sin2Ψ method, is valid for the stress determination from the X-ray diffraction data. However, the method fails if the samples are anisotropic because the method is constructed from some assumptions, one of which is that the samples are regarded as isotropic and homogeneous polycrystalline materials. Therefore, in order to be applicable the polycrystalline materials with ‹HKL› preferred orientation, the method was improved by the introduction of the rotation symmetry about the normal axis to the X-ray diffraction plane in this paper. The basic equation in the X-ray stress measurement i.e. the X-ray stress - lattice strain relation was derived for ‹HKL› preferred orientation in result. Then, the method applied to a centrifugal casting part, and was discussed in comparison with the sin2Ψ method.
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