Journal of the Society of Materials Science, Japan
Online ISSN : 1880-7488
Print ISSN : 0514-5163
ISSN-L : 0514-5163
Modeling and Simulation of X-Ray Stress Measurement Using PSPC as a Detector
Toru GOTOYu GONG
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2000 Volume 49 Issue 12Appendix Pages 275-280

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Abstract

Recently, the position sensitive proportional counter (PSPC) has been becoming popular as a detector for X-ray stress measurement. However, little information is available in the literature regarding the effects of specimen mis-setting and/or collimator misalignment on the stress measurement. Many factors such as the stress and the X-ray diffraction broadening of the specimen, the X-ray focus size, the dimensions of the collimator, the PSPC and the goniometer are complicatedly related to the effects of specimen mis-setting and/or collimator misalignment. In this paper, a modeling of the X-ray stress measurement using a PSPC as the detector is presented enabling us to simulate the stress measurement under various conditions. In the case of Ω assembly, the errors in stress measurement are illuminated under specimen mis-setting and/or collimator misalignment.

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