Published: April 15, 2001Received: September 04, 2000Available on J-STAGE: June 03, 2009Accepted: September 04, 2000
Advance online publication: -
Revised: -
Correction information
Date of correction: June 03, 2009Reason for correction: -Correction: DTRECEIVEDDetails: Right : 20000904
Date of correction: June 03, 2009Reason for correction: -Correction: TITLEDetails: Wrong : Lecture Right : Application of Reliability Engineering for Safety Design and Maintenance against Mechanical Structure and Components
Date of correction: June 03, 2009Reason for correction: -Correction: SUBTITLEDetails: Right : IV: Reliability Assessment and Reliability Test for Electronics Packaging
Date of correction: June 03, 2009Reason for correction: -Correction: AUTHORDetails: Right : Qiang YU1), Masaki SHIRATORI1)
Date of correction: June 03, 2009Reason for correction: -Correction: AFFILIATIONDetails: Right :
1) Dept. of Mech. Eng., Yokohama National Univ.
Date of correction: June 03, 2009Reason for correction: -Correction: KEYWORDDetails: Right : Electronics package, Reliability assessment, Interface mechanics, Low-cycle fatigue, Micro-structure testing
Date of correction: June 03, 2009Reason for correction: -Correction: CITATIONDetails: [in Japanese]