Temperature-Dependent EUV Spectra of Xenon Plasmas Observed in the Compact Helical System

Chihiro SUZUKI; Hiroaki NISHIMURA; Masayuki OCHIAI; Takako KATO; Shoichi OKAMURA; Richard M. MORE; Katsunobu NISHIHARA; Mitsuo NAKAI; Keisuke SHIGEMORI; Shinsuke FUJIOKA; Hiroaki OGAWA

doi:10.1585/jspf.81.480

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Temperature-Dependent EUV Spectra of Xenon Plasmas Observed in the Compact Helical System

Chihiro SUZUKI, Hiroaki NISHIMURA, Masayuki OCHIAI, Takako KATO, Shoichi OKAMURA, Richard M. MORE, Katsunobu NISHIHARA, Mitsuo NAKAI, Keisuke SHIGEMORI, Shinsuke FUJIOKA, Hiroaki OGAWA

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Keywords: EUV spectrum, xenon, CHS, grazing incidence spectrometer, wavelength calibration

JOURNAL FREE ACCESS

2005 Volume 81 Issue 7 Pages 480-481

DOI https://doi.org/10.1585/jspf.81.480

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Abstract

We carried out spectroscopic measurements of extreme ultraviolet (EUV) emissions from xenon (Xe) plasmas generated in the Compact Helical System (CHS) by a grazing incidence spectrometer with a spectral resolution of 0.05 nm. Spatial pro les of the electron density and temperature of the plasmas have been measured by laser Thomson scattering diagnostic system. A remarkable variation in spectral features by different electron temperatures was observed, and was attributed to the difference in dominant charge states of Xe ions in the plasma.

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