Abstracts for fall meeting of the Japanese Society for Planetary Science
Abstracts 2005 Fall Meeting of the Japanese Society for Planetary Science
Session ID : 1404
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Detection of sub-pixel scale roughness for asteroidal images
*Motohiro FuruyaNoriaki AsadaHirohide DemuraTooru OohashiYoshiaki Fujii
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
Selection for safe landing sites requires integration of maps; chemical composition, shape model, etc. We remark roughness map in sub-pixel scale, which is extracted by aliasing features. Interference between illuminated sub-pixel roughness and sampling period is called as the aliasing. This point regards different resolutions at the same area with asteroidal rotation as change of the sampling period. Although this method can detect only periodic features, we display its verification results.
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© 2005 The Japanese Society for Planetary Science
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