「かぐや（セレーネ）」搭載蛍光エックス線分光計のデータ処理・補正法

岡田 達明; 白井 慶; 山本 幸生; 荒井 武彦; 小川 和律; 白石 浩章; 岩崎 正統; 川村 太一; 森戸 久貴; 加藤 學

doi:10.14909/jsps.2007f.0.133.0

Abstracts 2007 Fall meeting of the Japanese Society for Planetary Sciences

Session ID : P38

DOI https://doi.org/10.14909/jsps.2007f.0.133.0

Conference information

Host: The Japanese Society for Planetary Sciences: Local Organizing Committee for 2007 Fall Meeting

Poster Session

Analytical method of SELENE XRS data interpretation and correction

*Tatsuaki Okada, Kei Shirai, Yukio Yamamoto, Takehiko Arai, Kazunori Ogawa, Hirokaki Shiraishi, Masatsuna Iwasaki, Taichi Kawamura, Hisataka Morito, Manabu Kato

Author information

*Tatsuaki Okada
Japan Aerospace Exploration Agency
Kei Shirai
Japan Aerospace Exploration Agency
Yukio Yamamoto
Japan Aerospace Exploration Agency
Takehiko Arai
Japan Aerospace Exploration Agency
Kazunori Ogawa
Tokyo Institute of Technology
Hirokaki Shiraishi
Japan Aerospace Exploration Agency
Masatsuna Iwasaki
Tokyo Institute of Technology
Taichi Kawamura
University of Tokyo
Hisataka Morito
University of Tokyo
Manabu Kato
Japan Aerospace Exploration Agency

CONFERENCE PROCEEDINGS FREE ACCESS

Details

Abstract

Analytical procedure and method is under development for the X-Ray Spectrometer onboard SELENE(Kaguya). We present the system in detail. Furterhmore, we investigate the datainterpretation for XRF, including the surface microscopic and macroscopic roughness as well as mineral mixing effects. For a daily automatic analysis for huge amount of data, correction equations for ther effects are necessary to be defined. We also present the currect status of the correction method.

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