Hyomen Kagaku
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
Special Issue on Recent Progress in Theoretical Study of Formation of Semiconductor Surfaces and Interfaces Based on Microscopic Processes
Reaction Kinetics during Initial Stage of Thermal Oxidation on Si(100) Surface
Maki SUEMITSU
Author information
JOURNAL FREE ACCESS

2002 Volume 23 Issue 2 Pages 95-103

Details
Abstract
Autocatalytic-reaction model, a chemical-kinetics model that provides an integrated description of various dynamical processes in the very initial oxidation of Si(100) surface, is illustrated. The nonlinear rate equation of this model has an analytical solution. With only two fitting parameters as it is, the solution quantitatively reproduces the experimental time-evolution of the surface oxide coverage in various oxidation modes, which range from the Langmuir-type in the low-temperature/high-pressure regime to the two-dimensional-island-growth-type in the high-temperature/low-pressure regime, or even to the one in the etching regime containing simultaneous decomposition of grown oxides in addition to their growth. Microscopic background behind the model is discussed in comparison with existing oxidation models and thin-film-growth models.
Content from these authors

この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
Previous article Next article
feedback
Top