Surface Electronic Structures of Semiconductor and Magnetic Materials Revealed by Synchrotron Radiation Analyses

Abstract

Synchrotron radiation surface research has shown drastic progress in these twenty years mainly owing to higher brilliance of synchrotron radiation sources and higher sensitivity and/or resolution of detectors. We have developed an in situ analysis system combined with a thin film growth chamber for advance device applications, and have used this system as a nano-space laboratory for analyzing surface/interface electronic structures.