Hyomen Kagaku
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
Special Issue: Forefront of Studies on Adhesion and Peeling Appeared at Various Systems
In-situ TEM Observation of Contact/Separation Process at the Nanoscale using MEMS Opposing Tips
Tadashi ISHIDATakaaki SATOHiroyuki FUJITA
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2013 Volume 34 Issue 2 Pages 79-84

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Abstract
For the better understanding of friction mechanism, it is important to study real contact points at the frictional interface. For this purpose, we originally built an experimental setup with micro electric mechanical system (MEMS) probes and a transmission electron microscope (TEM). Thanks to this setup, nanoscaled real contact points were formed and separated under in-situ TEM observation. The formation and the separation processes of real contact points were well visualized and those of silicon and gold real contact points were compared at the nanoscale.
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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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