Abstract
Zr/O/W Schottky emitter surface was investigated by using surface analytical techniques. We improved RHEED equipment by installing a heating stage and a micro-imaging system, and surface periodicity on the Zr/O/W(100) and (110) of a Schottky emitter tip have been directly measured. Reversible structural change from c(2×4) + c(4×2) to p(1×1) has been observed only in (100) surface. We also measured initial velocity of the secondary ions by using specialized TOF-SIMS and investigated generation sites of Zr, W, and their oxides. A structural model of a Zr/O/W surface was proposed that Zr atoms are adsorbed on O atoms in W-O layers formed on the W single crystal.
