Hyomen Kagaku
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
Transaction of the 35th Conference on Surface Science [I]
Atomic Force Microscopy for Visualization of Submolecular Structures
Tomoko K. SHIMIZUOscar CUSTANCE
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2016 Volume 37 Issue 7 Pages 320-325

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Abstract

Recent advances in non-contact atomic force microscopy (NC-AFM) allow us to visualize structural frameworks of small organic molecules. So far, metallic probes mounted on a stiff piezoelectric sensor in a qPlus configuration and functionalized with a CO molecule have been mostly used to observe relatively flat molecules that are adsorbed parallel to the surface. We have developed a new method that is capable of imaging 3D molecules and surface systems using a so-called multi-pass routine. This imaging method can be used with commercial Si cantilevers to obtain submolecular resolution under less demanding conditions compared to the CO-functionalized probe. In this report, we describe technical points, theoretical interpretation of image contrast, and examples of multi-pass images. A comparison with the previous method is also given to better understand our newly developed technique.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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