A Fast Intensity Measurement Device for Low Energy Electron Diffraction using a TV Camera and a Micro Computer

Abstract

This system was designed by us for the intensity-voltage curve measurements at the TV rate and for the analysis of the shape diffraction images. A frame memory was employed and it was connected through the bus line to the microcomputer. A scheme of this intensity measurement is desc-ribed. This system was applied to the analysis of Al overlayers on Si(111).