A Novel Method to Reduce Effects of Sample Tilt and Residual Weak Magnetic Field on LEED I(V) Curves

Abstract

LEED I(V) curves have been measured on Cu (001) under existence of sample tilt and residual weak magnetic field. It is demonstrated that “horizontal-beam method” can reduce the effect of beam misalignment. The validity of this method is discussed and the data obtained by using this method is shown.