APM Observation of the Surface Structure of Insulating Powders

Yasushi NAKANO; Kazuo SUGIYAMA; Yasushi TAKEUCHI; Tsuneo MATSUDA

doi:10.1380/jsssj.14.342

Yasushi NAKANO, Kazuo SUGIYAMA, Yasushi TAKEUCHI, Tsuneo MATSUDA

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JOURNAL FREE ACCESS

1993 Volume 14 Issue 6 Pages 342-346

DOI https://doi.org/10.1380/jsssj.14.342

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Published: August 10, 1993 Received: March 09, 1993 Available on J-STAGE: August 07, 2009 Accepted: May 06, 1993 Advance online publication: - Revised: -
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Date of correction: August 07, 2009 Reason for correction: - Correction: ABSTRACT Details: Wrong : A new method for the observation of surface morphology of insulating ceramic powders by means of atomic force microscopy (AFM) has been proposed. Several parameters for the measurements, such as the fixation methods of powders on a steel holder, the removing effect of static electricity and the influence of scan rates in AFM operation were examined. The quality of AFM images depended on how the powders were supported. In particular, a clear image was obtained when the powder was rigidly fixed on the holder by use of commercially available epoxy-type adhesives having Shore hardness values of 85 or above. Removal of static electricity by the combined use of an ion-blower and a conductive tip and also by slow-moving scanning of a probe led to a better clarity of the image. A detailed surface morphology (30nm × 3Onm) of silica fine powder could be obtained with a high resolution under the optimized operative conditions for AFM observation.
Right : A new method for the observation of surface morphology of insulating ceramic powders by means of atomic force microscopy (AFM) has been proposed. Several parameters for the measurements, such as the fixation methods of powders on a steel holder, the removing effect of static electricity and the influence of scan rates in AFM operation were examined. The quality of AFM images depended on how the powders were supported. In particular, a clear image was obtained when the powder was rigidly fixed on the holder by use of commercially available epoxy-type adhesives having Shore hardness values of 85 or above. Removal of static electricity by the combined use of an ion-blower and a conductive tip and also by slow-moving scanning of a probe led to a better clarity of the image. A detailed surface morphology (30nm × 3Onm) of silica fine powder could be obtained with a high resolution under the optimized operative conditions for AFM observation.

Abstract

A new method for the observation of surface morphology of insulating ceramic powders by means of atomic force microscopy (AFM) has been proposed. Several parameters for the measurements, such as the fixation methods of powders on a steel holder, the removing effect of static electricity and the influence of scan rates in AFM operation were examined. The quality of AFM images depended on how the powders were supported. In particular, a clear image was obtained when the powder was rigidly fixed on the holder by use of commercially available epoxy-type adhesives having Shore hardness values of 85 or above. Removal of static electricity by the combined use of an ion-blower and a conductive tip and also by slow-moving scanning of a probe led to a better clarity of the image. A detailed surface morphology (30nm × 3Onm) of silica fine powder could be obtained with a high resolution under the optimized operative conditions for AFM observation.

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