Hyomen Kagaku
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
XPS, PIXE Studies of GaAs Surfaces and Inferfaces
Hisao NAKASHIMA
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1985 Volume 6 Issue 1 Pages 2-11

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Abstract
In this overview, our group's work on GaAs surfaces and interfaces is described. Cleaning processes for GaAs (001) surfaces in ultra-high vacuum, and Au/GaAs interface formation were studied by XPS, RHEED and RBS. PIXE, in combination with channeling, was used to determine the lattice locations of Zn and Si in GaAs and GaAlAs.
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© The Surface Science Society of Japan
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