Hyomen Kagaku
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
Quantitative Electron Probe Microanalysis
Hiroyoshi SOEZIMA
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JOURNAL FREE ACCESS

1986 Volume 7 Issue 3 Pages 224-230

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Abstract

Quantitative analysis by electron probe microanalyzer has been well studied and established. Many methods of quantitative analysis are provided. 1. Working curve method, 2. ZAF method and 3. Bence-Albee method are well known and used. But these methods are not suited to some specimens. 4. Convergence method and 5. SEF method are convenient and are suited for all kinds of specimens. A new ZAF method is introduced. This method is very accurate for light elements, such as oxide, nitride, etc., and can be used for some specimens which have an undetectable element.
Quantitative analysis methods on thin films, small particles and sintered specimens are presented, too.

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© The Surface Science Society of Japan
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