Scanning Tunneling Microscopy

Abstract

The scanning tunneling microscope (STM) was invented less than five years ago by G. Binnig and H. Rohrer. In 1986 they were honored with the Nobel prize in physics, together with E. Ruska who invented the transmission electron microscope in 1933. The principles of the STM and the construction of the instruments are described by dividing them into several key technologies: (i) vibration isolation; (ii) course and fine positionings and scannings; (iii) thermal drift, hysteresis, and creep of piezoactuaters; (iv) metal probes; and (v) electronic control circuits. Surface structures recently observed by the STM on metals, semiconductors, etc. are reviewed. The future development of the STM is mentioned very briefly.