Formative Process and Microscopic Structure of Mn-Ferrite Thin Films

Abstract

Mn-ferrite films were obtained in atmosphere by the heat treatment of film samples which is prepared by evaporation from Fe-Mn-Bi source. There was tries to clarify its relation to microscopic structure and magnetic properties in terms of the formative process of Mn-ferrite thin films. The qualitative and quantitative analysis of Mn-ferrite was made measurements by X-ray diffractometer method and the chemical effect in the low energy Auger spectrum, respectively. The prepared films showed perpendicular magnetic anisotropy. The saturation magnetization (4πMs), remanent magnetization (4πMr^⊥), coercive force (Hc^⊥) and anisotropy field (H_k) were 4.4 (kG), 0.6 (kG), 350 (Oe), and 1.5 (kOe), respectively. The cause for the perpendicular anisotropy is attributed to the effects of the perpendicular configuration of column grains in the films and of induced magnetic annealing effect.