Published: November 10, 1988Received: September 12, 1988Available on J-STAGE: August 07, 2009Accepted: September 12, 1988
Advance online publication: -
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Correction information
Date of correction: August 07, 2009Reason for correction: -Correction: CITATIONDetails: Wrong : 1) G. Binnig and H. Rohrer: Surface Sci. 126, 236(1983); G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel: Phys. Rev. Lett. 49, 57 (1982). 2) R. Young, J. Ward and F. Scire: Rev. Sci. Instrum. 47, 1303 (1976). 3) E.W. Müller and T.T. Tsong: “Field lon Microscopy; Princlples and Applications”; (1969).
Right : 1) G. Binnig and H. Rohrer: Surface Sci. 126, 236(1983); G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel: Phys. Rev. Lett. 49, 57 (1982). 2) R. Young, J. Ward and F. Scire: Rev. Sci. Instrum. 47, 1303 (1976). 3) E.W. Müller and T.T. Tsong: “Field lon Microscopy; Princlples and Applications”; (1969).
A method to prepare a sharp tip for scanning tunneling microscope was described. A sharp W tip was obtained by electropolisching usingathin electrolyte layer formed on CCl4 solution. Thus obtained tip was applied for the measurement of an optical disc stamper surafce with dense pits.
