X-ray Diffraction Analysis of a Trace Amount of Components in Papers Using the High Speed Detector

Abstract

The X-ray diffraction has widely been used for identification and structural analysis of crystalline substances. Although the Scintillation detector （SC detector） is generally used for the X-ray diffraction analysis, the sensitivity is not enough for the qualitative analysis of a trace amount of components. Therefore, we investigated to apply the high speed detector to the X-ray diffraction analysis of a trace amount of components. The high speed detector detection unit with multiple semiconductor elements allows much shorter measurement time than the SC detector. Also the high speed detector has high sensitivity, and therefore is suitable for measurement of a trace amount of components. In this research, we report an example of analyzing trace substances in commercially available functional paper and red precipitate in the pipes with the high speed detector.