Abstract
In previous paper, sectioning techniques for optical microscopy were described. In this paper, sectioning techniques for SEM and EPMA were described and a new preparation technique for paper cross section using a focused ion beam (FIB) was also demonstrated. Several embedding methods using epoxy resin, methacrylate resin and so on are very effective to obtain very thin sections and to prevent creation of artifacts in optical microscopy. But the resin embedded sections reduce the contrast of the image and then distinct micrographs can not be obtained in scanning electron microscopy.
Further more, for observation and analysis by SEM and EPMA, it is not necessary to make a thin section, but to make a bulky section without damage of fine structure.
Instead of embedding the specimen before sectioning by microtome, a procedure in which the specimen is held between two plastics films such as polyvinyl chloride was applied and satisfactory results were obtained at comparative low magnifications (<10, 000×) for various papers except thin and porous specimen such as tissue paper.
Recently, a focused ion beam (FIB) technique which has been used for fine processing of semiconductor or metal was applied as an improved method for sectioning papers. By this technique smooth and damageless cross sections of various papers could successfully be prepared.
