Shinku
Online ISSN : 1880-9413
Print ISSN : 0559-8516
ISSN-L : 0559-8516
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Development of Rapid Screening Method for Brominated Flame Retardants and Hexavalent Chromium by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
Jiro NAKA, Noriko HIRANO, Hiroshi KUROKAWA
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2005 Volume 48 Issue 6 Pages 365-371

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© 2005 by The Vacuum Society of Japan
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