Shinku
Online ISSN : 1880-9413
Print ISSN : 0559-8516
ISSN-L : 0559-8516
Letter
Hydrophilic Silicon Oxide Film by Pulsed Plasma CVD
Yoshihiro KAIZUMA
Author information
JOURNAL FREE ACCESS

2007 Volume 50 Issue 10 Pages 635-638

Details
Abstract
  Hydrophilic silicon oxide film was formed at a low temperature (below 50°C) condition by pulsed plasma chemical vapor deposition (Pulsed Plasma CVD) method using by Si(CH3)4 (TMS), O2 and Ar as reactant gases. Pulsed Plasma CVD is the technique of preparing film by pulsed rf power supply and pulsed gas supply. And we found that Pulsed Plasma CVD technique is able to make a nanoscale roughness on the silicon oxide film. The roughened surface tended to be more hydrophilic than the smooth surface. Hydrophilic silicon oxide film could be used for demist glasses, and it made the stain go away easily. Sometimes when the film deposited on a mold, a nanoscale surface roughness was able to improve mold separation force.
Content from these authors
© 2007 by The Vacuum Society of Japan
Previous article Next article
feedback
Top