Noble Technique for Studying Secondary Electron Emission from MgO Surface as Protecting Insulator in Plasma Display Panel Cell

Abstract

Quantitative measurement of the surface potential and amount of charging under electron beam irradiation have been performed. The surface potential was measured by a secondary electron method. The results have revealed that the surface potential is induced by the sample current, where the sample behaves as a resistor. The amount of charging was obtained by time integration of the current contributing to charging, which was defined as the difference between the beam current and the sum of the sample and secondary electron currents. The amount of charging was found to be independent on the beam current under the present experimental condition. The present results have revealed that the present technique is well worthy to be applied to the study of the secondary electron emission from MgO film used as a protecting insulator in the plasma display panel cell.