KAGAKU KOGAKU RONBUNSHU
Online ISSN : 1349-9203
Print ISSN : 0386-216X
ISSN-L : 0386-216X
Materials and Devices
Shape Evolution of Microbumps
Kazuo KondoToshiaki MatsumotoZennosuke Tanaka
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2003 Volume 29 Issue 5 Pages 692-694

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Abstract

Bumps are high-density connectors between semiconductor devices and print-circuit boards. We have studied the effects of passivation ally layer heights on electrodeposited Au bumps, both experiment and by current density simulation.

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© 2003 by THE SOCIETY OF CHEMICAL ENGINEERS, JAPAN
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