KAGAKU KOGAKU RONBUNSHU
Online ISSN : 1349-9203
Print ISSN : 0386-216X
ISSN-L : 0386-216X
Gas-Phase Reaction Rate During ZrO2 Thin-Film Formation by LPMOCVD
Comparison of growth rate distributions obtained theoretically and experimentally
Yasunobu AkiyamaKatsuyuki NakanoTsuneyuki SatoNobuyuki Imaishi
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1992 Volume 18 Issue 6 Pages 840-848

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Abstract

ZrO2 thin films were prepared from β-diketonate complexes on the inner tube wall of a horizontal tubular hot-wall CVD reactor. Experimental temperature, pressure, flow rate and oxygen concentration were in the range of 823K-973K, 0.4 kPa-24 kPa, 0-1500sccm and 0-50 mol%, respectively.
The dependency of growth rate, color and crystal form of the deposited ZrO2 filmes on experimental conditions was studied experimentally.
Numerical calculations of the governing equations, with the gas-phase reaction rate constant as an unknown parameter, were conducted to determine the gas-phase reaction rate constant, with which the theoretical growth rate distributions can be fitted to the experimental ones for all runs. The activation energy of the gas-phase reaction, using Zr (DPM) 4 as a source compound, was found to be 140kJ/mol. This simulation also indicated that the pressure drop has to be taken into account in a LPCVD calculation.

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© by THE SOCIETY OF CHEMICAL ENGINEERS, JAPAN
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