2009 Volume 44 Issue 4 Pages 280-285
Convergent-beam electron diffraction (CBED) patterns are obtained by converging a conical electron beam on a nanometer-size specimen area. The CBED method enables us to determine specimen thicknesses, crystal symmetries, lattice parameters and strains, lattice defects and crystal structural parameters. Basics of the CBED method and tips for CBED experiments are described. Some applications of CBED are briefly outlined.