KENBIKYO
Online ISSN : 2434-2386
Print ISSN : 1349-0958
Lectures
Convergent-beam Electron Diffraction
Kenji Tsuda
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JOURNALS FREE ACCESS

2009 Volume 44 Issue 4 Pages 280-285

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Abstract

Convergent-beam electron diffraction (CBED) patterns are obtained by converging a conical electron beam on a nanometer-size specimen area. The CBED method enables us to determine specimen thicknesses, crystal symmetries, lattice parameters and strains, lattice defects and crystal structural parameters. Basics of the CBED method and tips for CBED experiments are described. Some applications of CBED are briefly outlined.

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© 2009 The Japanese Society of Microscopy
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