KENBIKYO
Online ISSN : 2434-2386
Print ISSN : 1349-0958
Research Today
Progress in Atomic Force Microscopy Techniques for Measurements of Local Dynamics at Solid-Liquid Interfaces
Takeshi Fukuma
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JOURNAL FREE ACCESS

2018 Volume 53 Issue 3 Pages 140-143

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Abstract

Atomic force microscopy (AFM) allows us to visualize atomic-scale surface structures at solid-liquid interfaces. However, the speed of the atomic-scale imaging by conventional AFM is limited to ~1 min/frame and hence imaging of dynamic events on the timescale of seconds has remained challenging. Recently, we have improved the imaging speed of AFM to ~1 s/frame without deteriorating the atomic-scale spatial resolution. In this article, I would like to introduce fundamental techniques that enabled this technical innovation and its application example.

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© 2018 The Japanese Society of Microscopy
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