KENBIKYO
Online ISSN : 2434-2386
Print ISSN : 1349-0958
Feature Articles: Observation of Atomic Displacements
Structural Analysis of Slight Cation Displacements Using Scanning Transmission Electron Microscopy
Shunsuke KobayashiTakahisa YamamotoYuichi Ikuhara
Author information
JOURNAL FREE ACCESS

2019 Volume 54 Issue 1 Pages 19-23

Details
Abstract

Scanning transmission electron microscopy is a powerful technique for analyzing materials at the atomic level. High-tech materials require design at the nanoscale level to optimize their properties. Analyzing changes in atomic positions near surface, heterointerfaces, and other crystalline defects with picometer-level precision are crucial to understand the relationships between structures and properties to be probed in unprecedented detail. In this study, we measured cation displacements at the (010) surface of Li-ion battery cathode material LiFePO4 and within multiphase nanodomains of a strained BaTiO3 film.

Content from these authors
© 2019 The Japanese Society of Microscopy
Previous article Next article
feedback
Top