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Introduction to Electron Ptychography by Pixelated STEM Detector
Kazutaka MitsuishiKatsuaki NakazawaTeruyasu MizoguchiRyusuke SagawaYuichi Yamasaki
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2021 Volume 56 Issue 1 Pages 31-37

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Abstract

Ptychography is a method of obtaining the transmission function of a sample from multiple diffraction patterns. Although it has received little attention, especially in electron beam ptychography, it has a long history, more than 50 years after its proposal. In recent years, with the advent of new detectors and improvements in computer performance, great progress has been made, and expectations are rising for practical methods. Ptychography, on the other hand, is a computer-aided method of obtaining phase from a set of diffraction patterns from multiple points, which is difficult to understand intuitively.

In this article, we will elaborate on the principles and phase reconstruction procedures using pixelated detectors, such as single-sideband method with focused probe and iterative methods with defocused probe, in order to encourage new researchers will join and contribute to this new and engaging area.

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© 2021 The Japanese Society of Microscopy
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