Denshi kenbikyo
Print ISSN : 0417-0326
Focused Ion Beam system and its application
Tatsuya Adachi
Author information
JOURNAL FREE ACCESS

1996 Volume 30 Issue 3 Pages 237-244

Details
Download PDF (6522K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Article 1st page
Content from these authors
© The Japanese Society of Microscopy
Previous article Next article
Favorites & Alerts

Recently viewed articles
Successor

KENBIKYO

Share this page
feedback
 Top