1998 Volume 64 Issue 623 Pages 2492-2497
In this paper, we attempt to identify parameters of the system by using an image processing method. The parameter identification is one of the inverse problems and sensibly on noise. High accuracy of parameter identification needs high accuracy of measurement. Though the image processing method has good features, i.e., non-contact method, high flexibility of setting and so on, many researchers paid little attention on this method because of its low accuracy. In this paper, we examined the approach that made up for defect of image sensing to carry out identification of parameters in case of a non uniform beam.