Abstracts for the 50th Anniversary Meeting (2002) of the Mineralogical Society of Japan
Conference information
Host: The Mineralogical Society of Japan
Synthetic silica glass for trace aluminum analysis in quartz by electron microprobe
Keywords:
Al-doped silica glass,
trace aluminum analysis of quartz,
electron microprobe,
wavelength shift,
linearity of intensity
Pages 78
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Article 1st page
