ATEM observation of the interface between Fe and FexO using a focused ion beam milling method

nobuyoshi miyajima; ken niwa; masaki ichihara; takehiko yagi

doi:10.14824/kobutsu.2003.0.84.0

Abstracts for the Meeting (2003) of the Mineralogical Society of Japan

Session ID : K5-02

DOI https://doi.org/10.14824/kobutsu.2003.0.84.0

Conference information

Host: The Mineralogical Society of Japan

ATEM observation of the interface between Fe and Fe_xO using a focused ion beam milling method

*nobuyoshi miyajima, ken niwa, masaki ichihara, takehiko yagi

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Keywords: Focused ion beam, analytical transmission electron microscope, Fe-Fe_xO interface, stoichiometry

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Abstract

Focused ion beam (FIB) milling is the new means by which mineral sections are thinned to electron transparency for analytical transmission electron microscope (ATEM). We have analyzed the interface between α-Fe and Fe_xO using a combined method of FIB milling and ATEM.

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